Introduce Scanning Probe Microscopy into Education

Page: 153

Z. Hájkováa, A. Fejfara, M. Ledinskýa, V. Píča, F. Křížeka, D. Šulcb, Z. Nováčekb, and P. Wertheimerb

aInstitute of Physics, Academy of Sciences of the Czech Republic, Prague, bBrno University of Technology, Brno

Keywords: scanning probe microscopy, scanning tunnelling microscopy, atomic force microscopy, models, demonstrations, analogies, educational materials

 

Contemporary chemistry, physics, as well as biology frequently deal with the structure of matter at nanoscale level. One of the most important techniques used for ima¬ging and measuring surfaces at the nanoscale (sometimes even with atomic resolution) is the scanning probe microscopy (SPM). SPM is an important up-and-coming technique in both academic sphere and industry. For this reason, concepts underlying SPM should be mentioned in secondary education, at least for students with an interest in science and technical subjects. In order to introduce SPM into secondary science education, various teaching approaches might be followed. In this contribution, special attention is paid to simple models and analogies of SPM to illustrate the basic SPM principles.

 

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